FIB – STRATA DB 235
Details
Description:
The FEI Strata DB 235 is a high-resolution, small-stage DualBeam system (FIB/SEM). It combines a Field Emission Scanning Electron Microscope (SEM) with a Focused Ion Beam (FIB) for precision imaging, milling, and deposition.
Specifications
- SEM Field Emission Gun – resolution @ 15kV ~3 nm
- Colonna FIB Ga+ LMIS (1 pA–20 nA, 5–30 kV)
- Stage compucentrico motorizzato 5 assi (50×50 mm)
- Rivelatori: ETD, TLD, CDEM/CDM
- GIS (Pt, W, Enhanced etching)
- Omniprobe per lift-out in situ
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