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Characterization

Characterization

Keyence

Digital Microscope – Keyence VHX-X1

lyncéè tec

Vibrometer – Lyncée Tec DHM®-R2105

Specs

ArPES System for Advanced Spectroscopy – Specs

Advanced Research Systems

Vacuum Probe Station – ARS PS-L Flow Cryostat

LEO/ZEISS and RAITH

SEM with EDX + EBL – LEO 1525 + Raith Elphy Plus

Zeiss

SEM with EDX – ZEISS Ultra55

Thermo Fisher

FIB – STRATA DB 235

Rigaku

X-Ray Diffractometer Rigaku SmartLab XE

KLA TENCOR

Profilometer – KLA Tencor P-17

Filmetrics

Thin-Film Mapping – Filmetrics F54-XY-200-UVX

J.A. Woollam

Spectroscopic Ellipsometer – J.A. Woollam VASE

Filmetrics

Optical Profiler – Filmetrics Profilm3D

Keysight Technologies

AFM System – Keysight 5600LS

Mitutoyo

Optical Microscope – Mitutoyo MF-Hyper

Leica

Optical Microscope – Leica FTM 200

Jandel

Sheet Resistance Measurement – Jandel 4-point probe

Metricon

Prism Coupler – Metricon 2010

Nikon

Optical Microscope – Nikon Eclipse ME600

SÜSS MicroTec AG

Probe Station – SÜSS MicroTec PM5

J.A. Woollam

Spectroscopic Ellipsometer – J.A. Woollam VASE (Remote Access)

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